@article{farhan22wafermap,
  title={High Accuracy Swin Transformers for Image-based Wafer Map Defect Detection},
  author={Thahmidul I. Nafi, Erfanul Haque, Faisal Farhan, Asif Rahman},
  journal={International Journal of Engineering and Manufacturing (IJEM)},
  volume={12},
  pages={10--21},
  year={2022},
  publisher={MECS}
}